PUB-2017-ERT

Experimental Route to Scanning Probe Hot-Electron Nanoscopy (HENs) Applied to 2D Material

Andrea Giugni, Bruno Torre, Marco Allione, Gobind Das, Zhenwei Wang, Xin He,  Husam N. Alshareef, and Enzo Di Fabrizio “Experimental Route to Scanning Probe Hot-Electron Nanoscopy (HENs) Applied to 2D Material”
​​Adv. Optical Mater.​ DOI: 10.1002/adom.201700195​
Andrea Giugni, Bruno Torre, Marco Allione, Gobind Das, Zhenwei Wang, Xin He, Husam N. Alshareef, and Enzo Di Fabrizio
Hot-Electron Nanoscopy, 2D-materials
2017
​This paper presents details on a new experimental apparatus implementing the hot electron nanoscopy (HENs) technique introduced for advanced spec-troscopies on structure and chemistry in few molecules and interface prob-lems. A detailed description of the architecture used for the laser excitation of surface plasmons at an atomic force microscope (AFM) tip is provided. The photogenerated current from the tip to the sample is detected during the AFM scan. The technique is applied to innovative semiconductors for applica-tions in electronics: 2D MoS2 single crystal and a p-type SnO layer. Results are supported by complementary scanning Kelvin probe microscopy, tradi-tional conductive AFM, and Raman measurements. New features highlighted by HEN technique reveal details of local complexity in MoS2 and polycrystal-line structure of SnO at nanometric scale otherwise undetected. The tech-nique set in this paper is promising for future studies in nanojunctions and innovative multilayered materials, with new insight on interfaces.