Battery Characterization

Multi-Channel Potentiostat
In-situ Potentiostat / Galvanostat Module
Electrochemical Workstation (CH Instruments)
Modular Materials Test System
Electrochemical Quartz Microbalance
Automatic Battery Testing System
Automatic Resistance Measurement System
Redox Flow Cell Test
Temperature Control Chamber
Constant Temperature Oven
Glass Vacuum Oven
Optical Microscope
Balance

Thin Film and Device Characterization

Thermoelectric​ Measurement System
Solartron electrochemical work station
Cascade Probe Station with Heating capability
Atomic Force Microscope (AFM)
Ferroelectric Test System
Solar Simulator
Internal Photoemission System
Nanostructured Materials characterization
Closed-loop Cryo Probe Station and Sensor Characterization System
Keithley Semiconductor characterization system

Thin Film Deposition Capabilities

Pulsed Laser Deposition (PLD-MBE)
Multi-source Sputter Deposition (PVD)
Chemical Synthesis with integrated Thermal and e-beam evaporation
Atomic Layer Deposition (ALD)
Oxide Nanotube Chemical Vapor Deposition​ (CVD)