Thin Film and Device Characterization

Thermoelectric​ Measurement System
Solartron electrochemical work station
Cascade Probe Station with Heating capability
Atomic Force Microscope (AFM)
Ferroelectric Test System
Solar Simulator
Internal Photoemission System
Nanostructured Materials characterization
Closed-loop Cryo Probe Station and Sensor Characterization System
Keithley Semiconductor characterization system

Thin Film Deposition Capabilities

Pulsed Laser Deposition (PLD-MBE)
Multi-source Sputter Deposition (PVD)
Chemical Synthesis with integrated Thermal and e-beam evaporation
Atomic Layer Deposition (ALD)
Oxide Nanotube Chemical Vapor Deposition​ (CVD)